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Conference Paper

The role of microanalysis in the characterization of interfaces

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons76016

Rühle,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75440

Elsässer,  C.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76047

Scheu,  C.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76113

Sigle,  W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Rühle, M., Elsässer, C., Scheu, C., & Sigle, W. (2000). The role of microanalysis in the characterization of interfaces. In D. B. Williams, & R. Shimizu (Eds.), Microbeam Analysis 2000: Proceedings of the Second Conference of the International Union of Microbeam Analysis Societies (pp. 1-2). Bristol: Institute of Physics Publ.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-39AB-B
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