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Conference Paper

Rigorous mathematical models for the reconstruction of thin films profiles from X-ray intensities

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons75447

Ern,  C.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75415

Dosch,  H.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Theoretische und Angewandte Physik;

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Citation

Slavyanov, S., Ern, C., & Dosch, H. (2000). Rigorous mathematical models for the reconstruction of thin films profiles from X-ray intensities. In I. V. Andronov (Ed.), Proceedings of Days of Diffraction (pp. 161-167). St. Petersburg/Russia: SPbU.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-38B6-A
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