Self-diffusion studies on 15N in amorphous Si3BC4.3N2 ceramics with ion 
implantation and secondary ion mass spectrometry

Schmidt, H.; Borchardt, G.; Weber, S.; Scherrer, S.; Baumann, H.; Müller, A.; Bill, J.

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

Self-diffusion studies on ¹⁵N in amorphous Si₃BC_4.3N₂ ceramics with ion implantation and secondary ion mass spectrometry

MPS-Authors

/persons/resource/persons75874

Müller, A.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Schmidt, H., Borchardt, G., Weber, S., Scherrer, S., Baumann, H., Müller, A., et al. (2000). Self-diffusion studies on ¹⁵N in amorphous Si₃BC_4.3N₂ ceramics with ion implantation and secondary ion mass spectrometry. Journal of Applied Physics, 88, 1827-1830.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-38B0-5

Abstract

There is no abstract available