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An X-ray reflectivity study of solution-deposited ZrO2 thin films on SAMs: growth, interface properties, and thermal densification

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons76001

Ritley,  K. A.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75642

Just,  K.-P.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76071

Schreiber,  F.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75415

Dosch,  H.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Theoretische und Angewandte Physik;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75895

Niesen,  T. P.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75211

Aldinger,  F.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Nichtmetallische Anorganische Materialien;

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Citation

Ritley, K. A., Just, K.-P., Schreiber, F., Dosch, H., Niesen, T. P., & Aldinger, F. (2000). An X-ray reflectivity study of solution-deposited ZrO2 thin films on SAMs: growth, interface properties, and thermal densification. Journal of Materials Research, 15, 2706-2713.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-38AC-2
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