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Analysis of segregation behaviour of grain boundaries in α-Al2O3 by analytical and high-resolution TEM.

MPS-Authors
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Nufer,  S.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Gemming,  T.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Kurtz,  W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Rühle,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Nufer, S., Gemming, T., Kurtz, W., & Rühle, M. (2000). Analysis of segregation behaviour of grain boundaries in α-Al2O3 by analytical and high-resolution TEM. In L. Frank, & F. Ciampor (Eds.), Proceedings of the 12th European Congress on Electron Microscopy, Vol. 2 (pp. 107-108). Brno/Czech Republic: Czechoslovak Society for Electron Microscopy.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-389E-2
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