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Conference Paper

EDS study of planar faults in SrO doped SrTiO3

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons76172

Sturm,  S.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76047

Scheu,  C.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Sturm, S., Recnik, A., Scheu, C., & Ceh, M. (2000). EDS study of planar faults in SrO doped SrTiO3. In J. Gemperlova, & I. Vavra (Eds.), Proceedings of the 12th European Congress on Electron Microscopy. Vol. 2: Physical Sciences (pp. 221-222). Czechoslovak Society for Electron Microscopy.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-384E-7
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