EDS study of planar faults in SrO doped SrTiO3

Sturm, S.; Recnik, A.; Scheu, C.; Ceh, M.

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EDS study of planar faults in SrO doped SrTiO₃

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Sturm, S.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Scheu, C.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Sturm, S., Recnik, A., Scheu, C., & Ceh, M. (2000). EDS study of planar faults in SrO doped SrTiO₃. In J. Gemperlova, & I. Vavra (Eds.), Proceedings of the 12th European Congress on Electron Microscopy. Vol. 2: Physical Sciences (pp. 221-222). Czechoslovak Society for Electron Microscopy.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-384E-7

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