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Advanced instrumentations for interface studies by electron energy-loss spectroscopy (EELS, ELNES and ESI)?

MPS-Authors
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Rühle,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Elsässer,  C.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Scheu,  C.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Sigle,  W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Rühle, M., Elsässer, C., Scheu, C., & Sigle, W. (2000). Advanced instrumentations for interface studies by electron energy-loss spectroscopy (EELS, ELNES and ESI)? In G. Bailey (Ed.), Microscopy and Microanalysis 2000 (pp. 188-189). New York: Springer.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-383A-4
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