de.mpg.escidoc.pubman.appbase.FacesBean
English
 
Help Guide Disclaimer Contact us Login
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Conference Paper

Quantitative high-resolution electron microscopy studies of strain distribution and defect formation in III-V semiconductor quantum dots

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons75634

Jin-Phillipp,  N. Y.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75421

Du,  K.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75946

Phillipp,  F.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

Locator
There are no locators available
Fulltext (public)
There are no public fulltexts available
Supplementary Material (public)
There is no public supplementary material available
Citation

Jin-Phillipp, N. Y., Du, K., & Phillipp, F. (2000). Quantitative high-resolution electron microscopy studies of strain distribution and defect formation in III-V semiconductor quantum dots. In K. Yoshihara (Ed.), Fabrication and Characterization of Atomic Scale Structures. Proceedings of the 5th International Symposium on Advanced Physical Fields (pp. 33-39). Tokyo: National Research Institute for Metals.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-37C4-1
Abstract
There is no abstract available