English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Conference Paper

Direct strain measurements in InP/GaInP quantum dots by HREM

MPS-Authors
/persons/resource/persons75634

Jin-Phillipp,  N. Y.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75946

Phillipp,  F.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Jin-Phillipp, N. Y., & Phillipp, F. (2000). Direct strain measurements in InP/GaInP quantum dots by HREM. In P. Ciampor, L. Frank, J. Gemperlova, & I. Vavra (Eds.), Proceedings of the 12th European Congress on Electron Microscopy. Vol. 2: Physical Sciences (pp. 299-300). Brno: Czechoslovak Society for Electron Microscopy.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-37BE-2
Abstract
There is no abstract available