English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
  Local TagsRelease HistoryDetailsSummary

Released
Conference Paper

Influence of experimental parameters on the accuracy of lattice-distortion measurements directly from high-resolution micrographs

MPS-Authors
/persons/resource/persons75421

Du,  K.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75634

Jin-Phillipp,  N. Y.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75946

Phillipp,  F.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Du, K., Jin-Phillipp, N. Y., & Phillipp, F. (2000). Influence of experimental parameters on the accuracy of lattice-distortion measurements directly from high-resolution micrographs. In P. Ciampor, L. Frank, P. Tomanek, & R. Kolarik (Eds.), Proceedings of the 12th European Congress on Electron Microscopy. Vol. 3 (pp. 137-138). Brno: Czechoslovak Society for Electron Microscopy.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-3787-D
Abstract
There is no abstract available