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Influence of experimental parameters on the accuracy of lattice-distortion measurements directly from high-resolution micrographs

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons75421

Du,  K.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75634

Jin-Phillipp,  N. Y.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75946

Phillipp,  F.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Du, K., Jin-Phillipp, N. Y., & Phillipp, F. (2000). Influence of experimental parameters on the accuracy of lattice-distortion measurements directly from high-resolution micrographs. In P. Ciampor, L. Frank, P. Tomanek, & R. Kolarik (Eds.), Proceedings of the 12th European Congress on Electron Microscopy. Vol. 3 (pp. 137-138). Brno: Czechoslovak Society for Electron Microscopy.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-3787-D
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