Arzt, E. Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society; Universität Stuttgart, Institut für Metallkunde;
Baker, S. P., Yoo, Y. C., Knauß, M. P., & Arzt, E. (2000). Electromigration damage in mechanically deformed Al conductor lines: Dislocations as fast diffusion paths. Acta Materialia, 48, 2199-2208.