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Morphology and microstructure of the Ar+ion sputtered (0001)α-Al2O3 surface

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons76047

Scheu,  C.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76249

Wagner,  T.
Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75493

Gemming,  T.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75609

Hosoda,  N.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76016

Rühle,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Akatsu, T. C., Scheu, C., Wagner, T., Gemming, T., Hosoda, N., Suga, T., et al. (2000). Morphology and microstructure of the Ar+ion sputtered (0001)α-Al2O3 surface. Applied Surface Science, 165, 159-165.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-3754-0
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