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Isotopic mass and lattice constant of Si and Ge: X-Ray standing wave measurements

MPS-Authors

Zegenhagen,  J.
Max Planck Society;

Konuma,  M.
Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75950

Plachke,  D.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75350

Carstanjen,  H. D.
Former Central Scientific Facility Pelletron Accelerator, Max Planck Institute for Intelligent Systems, Max Planck Society;
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

Cardona,  M.
Max Planck Society;

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Citation

Zegenhagen, J., Kazimirov, A., Cao, L. X., Konuma, M., Sozontov, E., Plachke, D., et al. (2001). Isotopic mass and lattice constant of Si and Ge: X-Ray standing wave measurements. In N. Miura (Ed.), Proceedings of the 25th Conference on the Physics of Semiconductors (pp. 125-127). Berlin [et al.]: Springer.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-36FF-7
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