Ion beam analysis with monolayer depth resolution using the electrostatic 
spectrometer at the MPI Stuttgart

Plachke, D.; Blohm, G.; Fischer, T.; Khellaf, A.; Kruse, O.; Stoll, H.; Carstanjen, H. D.

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Ion beam analysis with monolayer depth resolution using the electrostatic spectrometer at the MPI Stuttgart

MPS-Authors

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Plachke, D.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75673

Khellaf, A.
Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons76160

Stoll, H.
Former Central Scientific Facility ANKA Synchroton Beamline, Max Planck Institute for Intelligent Systems, Max Planck Society;
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75350

Carstanjen, H. D.
Former Central Scientific Facility Pelletron Accelerator, Max Planck Institute for Intelligent Systems, Max Planck Society;
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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引用

Plachke, D., Blohm, G., Fischer, T., Khellaf, A., Kruse, O., Stoll, H., & Carstanjen, H. D. (2001). Ion beam analysis with monolayer depth resolution using the electrostatic spectrometer at the MPI Stuttgart. In J., Duggan, & I., Morgan (Eds.), Proceedings of the 16th International Conference on Applications of Accelerators in Research and Industry (pp. 458-462). Melville, New York: AIP.

引用: https://hdl.handle.net/11858/00-001M-0000-0010-36E3-3

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