Gumbsch, P. Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Kugimiya, T., Shibutani, Y., & Gumbsch, P. (2001). Crack-tip field analyses of silicon using order (N) tight-binding method. In Materials Science for the 21st Century. Vol. B (pp. 285-288).
