Methodological aspects of the high-energy synchrotron x-ray diffraction 
technique for internal stress evaluation

Wanner, A.; Dunnand, D. C.

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Methodological aspects of the high-energy synchrotron x-ray diffraction technique for internal stress evaluation

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Wanner, A.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Wanner, A., & Dunnand, D. C. (2001). Methodological aspects of the high-energy synchrotron x-ray diffraction technique for internal stress evaluation. Journal of Neutron Research, 9, 495-501.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-365A-C

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