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Observations of dislocation motion and stress inhomogeneities in a thin copper film

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons75245

Balk,  T. J.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75388

Dehm,  G.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75228

Arzt,  E.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Metallkunde;

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Citation

Balk, T. J., Dehm, G., & Arzt, E. (2001). Observations of dislocation motion and stress inhomogeneities in a thin copper film. In O. Kraft, K. Schwarz, S. Baker, B. Freund, & R. Hull (Eds.), Dislocations and Deformation Mechanisms in Thin Films and Small Structures (pp. P2.7.1-P2.7.6). Warrendale, PA, USA: MRS.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-362C-1
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