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Identification of vacancies on each sublattice of SiC by coincident Doppler broadening of the positron annihilation photons after electron irradiation

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons75815

Major,  J.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Müller, M. A., Rempel, A. A., Reichle, K., Sprengel, W., Major, J., & Schaefer, H. E. (2001). Identification of vacancies on each sublattice of SiC by coincident Doppler broadening of the positron annihilation photons after electron irradiation. In W. Triftshäuser (Ed.), Positron Annihilation. Proceedings of the 12th International Conference on Positron Annihilation (pp. 70-72). Zürich-Uetikon: Trans Tech Publications.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-3620-A
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