English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Conference Paper

Identification of vacancies on each sublattice of SiC by coincident Doppler broadening of the positron annihilation photons after electron irradiation

MPS-Authors
/persons/resource/persons75815

Major,  J.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Müller, M. A., Rempel, A. A., Reichle, K., Sprengel, W., Major, J., & Schaefer, H. E. (2001). Identification of vacancies on each sublattice of SiC by coincident Doppler broadening of the positron annihilation photons after electron irradiation. In W. Triftshäuser (Ed.), Positron Annihilation. Proceedings of the 12th International Conference on Positron Annihilation (pp. 70-72). Zürich-Uetikon: Trans Tech Publications.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-3620-A
Abstract
There is no abstract available