de.mpg.escidoc.pubman.appbase.FacesBean
English
 
Help Guide Disclaimer Contact us Login
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Conference Paper

A new approach to understanding electromigration in Al(Cu) alloys on an atomistic basis

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons75539

Gumbsch,  P.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75228

Arzt,  E.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Metallkunde;

Locator
There are no locators available
Fulltext (public)
There are no public fulltexts available
Supplementary Material (public)
There is no public supplementary material available
Citation

Schmidt, C., Dekker, J. P., Gumbsch, P., & Arzt, E. (2001). A new approach to understanding electromigration in Al(Cu) alloys on an atomistic basis. In Y. Limoge (Ed.), Proceedings of DIMAT 2000, the Fifth International Conference on Diffusion in Materials (pp. 151-156). Uetikon-Zürich: Scitec Publications Ltd.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-35EB-E
Abstract
There is no abstract available