Tracer self-diffusion studies in amorphous Si-(B)-C-N ceramics using ion 
implantation and SIMS

Schmidt, H.; Borchardt, G.; Baumann, H.; Weber, S.; Scherrer, S.; Müller, A.; Bill, J.

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Tracer self-diffusion studies in amorphous Si-(B)-C-N ceramics using ion implantation and SIMS

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Müller, A.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Schmidt, H., Borchardt, G., Baumann, H., Weber, S., Scherrer, S., Müller, A., et al. (2001). Tracer self-diffusion studies in amorphous Si-(B)-C-N ceramics using ion implantation and SIMS. In Y. Limoge (Ed.), Proceedings of DIMAT 2000, the Fifth International Conference on Diffusion in Materials (pp. 941-946). Uetikon-Zürich: Scitec Publications Ltd.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-35E4-B

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