A portable ultrahigh vacuum organic molecular beam deposition system for in 
situ x-ray diffraction measurements

Ritley, K. A.; Krause, B.; Schreiber, F.; Dosch, H.

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A portable ultrahigh vacuum organic molecular beam deposition system for in situ x-ray diffraction measurements

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Ritley, K. A.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Krause, B.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Schreiber, F.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Dosch, H.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Theoretische und Angewandte Physik;

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Ritley, K. A., Krause, B., Schreiber, F., & Dosch, H. (2001). A portable ultrahigh vacuum organic molecular beam deposition system for in situ x-ray diffraction measurements. Review of Scientific Instruments, 72(2), 1453-1457.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-357F-2

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