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Subsurface nanoindentation deformation of Cu-Al multilayers mapped in 3D by focused ion beam microscopy

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons76249

Wagner,  T.
Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Inkson, B. J., Steer, T., Möbus, G., & Wagner, T. (2001). Subsurface nanoindentation deformation of Cu-Al multilayers mapped in 3D by focused ion beam microscopy. Journal of Microscopy, 201, 256-269.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-3573-9
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