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Conference Paper

New Type of Dislocation Mechanism in Ultrathin Copper Films

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons75245

Balk,  T. J.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75388

Dehm,  G.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75228

Arzt,  E.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Metallkunde;

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Citation

Balk, T. J., Dehm, G., & Arzt, E. (2002). New Type of Dislocation Mechanism in Ultrathin Copper Films. In C. Ozkan, R. Cammarata, L. Freund, & H. Gao (Eds.), Thin Films: Stresses and Mechanical Properties IX (pp. L2.7.1-L2.7.6).


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-32B7-B
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