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Trenches around and between self-assembled silicon/germanium islands grown on silicon substrates investigated by atomic force microscopy

MPS-Authors

Denker,  U.
Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75634

Jin-Phillipp,  N. Y.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Denker, U., Daschiel, M., Jin-Phillipp, N. Y., & Schmidt, O. G. (2002). Trenches around and between self-assembled silicon/germanium islands grown on silicon substrates investigated by atomic force microscopy. Materials Science and Engineering B, 89, 166-170.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-3298-2
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