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Spatially resolved analytical electron microscopy at grain boundaries of α-Al2O3

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons75905

Nufer,  S.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75826

Marinopoulos,  A. G.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75440

Elsässer,  C.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75741

Kurtz,  W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76016

Rühle,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Nufer, S., Marinopoulos, A. G., Elsässer, C., Kurtz, W., & Rühle, M. (2002). Spatially resolved analytical electron microscopy at grain boundaries of α-Al2O3. Journal of Materials Science & Technology, 18(2), 189-190.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-31F0-2
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