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Submicron X-ray diffraction and its applications to problems in materials and environmental science.

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons76138

Spolenak,  R.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Tamura, N., Celestre, R. S., MacDowell, A. A., Padmore, H. A., Spolenak, R., Valek, B. C., et al. (2002). Submicron X-ray diffraction and its applications to problems in materials and environmental science. Review of Scientific Instruments, 73(3), 1369-1372.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-31C9-B
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