Spolenak, R. Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Tamura, N., MacDowell, A. A., Celestre, R. S., Padmore, H. A., Valek, B., Bravman, J. C., et al. (2002). High spatial resolution grain orientation and strain mapping in thin films using polychromatic submicron X-ray diffraction. Applied Physics Letters, 80(20), 3724-3726.