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Schädigungsverhalten von Kupfer-Leiterbahnen unter Wechselstrombelastung

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Orso,  S.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Orso, S. (2002). Schädigungsverhalten von Kupfer-Leiterbahnen unter Wechselstrombelastung. Diploma Thesis, Universität Stuttgart, Stuttgart.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-30FA-5
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