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Interplay between chemical and magnetic roughness of Pt in a Pt/Co bilayer investigated with X-ray resonant magnetic reflectometry

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons75492

Geissler,  J.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75502

Goering,  E.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76271

Weigand,  F.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76085

Schütz,  G.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Geissler, J., Goering, E., Weigand, F., & Schütz, G. (2002). Interplay between chemical and magnetic roughness of Pt in a Pt/Co bilayer investigated with X-ray resonant magnetic reflectometry. Zeitschrift für Metallkunde, 93(10), 946-952.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-2FD6-F
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