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Progress in the preparation of cross-sectional TEM specimens by ion-beam thinning

MPS-Authors
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Strecker,  A.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Bäder,  U.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Kelsch,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Salzberger,  U.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Sycha,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Gao,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Richter,  G.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society;

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van Benthem,  K.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Strecker, A., Bäder, U., Kelsch, M., Salzberger, U., Sycha, M., Gao, M., et al. (2003). Progress in the preparation of cross-sectional TEM specimens by ion-beam thinning. Zeitschrift für Metallkunde, 94, 290-297.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-2F39-F
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