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Creep behavior and microstructural changes during short-term creep in a gamma-TiAl based alloy with fully lamellar microstructure

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons75358

Chatterjee,  A.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75371

Clemens,  H.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75388

Dehm,  G.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75228

Arzt,  E.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Metallkunde;

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Citation

Chatterjee, A., Clemens, H., Dehm, G., Mecking, H., & Arzt, E. (2003). Creep behavior and microstructural changes during short-term creep in a gamma-TiAl based alloy with fully lamellar microstructure. In Y. W. Kim, & H. R. Clemens A. H. (Eds.), Gamma Titanium Aluminides 2003 (pp. 425-430). Warrendale, PA: TMS.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-2F2F-7
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