Spolenak, R. Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Spolenak, R., Wendrock, H., & Wetzig, K. (2003). Electromigration in Metallization Layers. In K. Wetzig, & C. M. Schneider (Eds.), Metal Based Thin Films for Electronics (pp. 205-221). Weinheim: Wiley-VCH.