English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
  Local TagsRelease HistoryDetailsSummary

Released
Journal Article

Transmission electron microscopy investigation of the microstructure and chemistry of Si/Cu/In/Cu/Si interconnections

MPS-Authors
/persons/resource/persons76129

Sommadossi,  S.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75544

Gust,  W.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75858

Mittemeijer,  E. J.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Materialwissenschaft;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Sommadossi, S., Litynska, L., Zieba, P., Gust, W., & Mittemeijer, E. J. (2003). Transmission electron microscopy investigation of the microstructure and chemistry of Si/Cu/In/Cu/Si interconnections. Materials Chemistry and Physics, 81, 566-568.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-2D96-9
Abstract
There is no abstract available