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Internal stress measurements by high-energy synchrotron X-ray diffraction at increased specimen-detector distance

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons75305

Böhm,  J.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76263

Wanner,  A.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75371

Clemens,  H.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Böhm, J., Wanner, A., Kampmann, R., Franz, H., Liss, K.-D., Schreyer, A., et al. (2003). Internal stress measurements by high-energy synchrotron X-ray diffraction at increased specimen-detector distance. Nuclear Instruments and Methods in Physics Research B, 200, 315-322.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-2D46-E
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