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Preparation of hard-to-make TEM samples using the FIB microscope

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons76232

Volkert,  C. A.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75570

Heiland,  B.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75661

Kauffmann,  F.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Volkert, C. A., Heiland, B., & Kauffmann, F. (2003). Preparation of hard-to-make TEM samples using the FIB microscope. Praktische Metallographie-Practical Metallography, 40(4), 193-208.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-2CE8-C
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