English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
  Local TagsRelease HistoryDetailsSummary

Released
Journal Article

Preparation of hard-to-make TEM samples using the FIB microscope

MPS-Authors
/persons/resource/persons76232

Volkert,  C. A.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75570

Heiland,  B.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75661

Kauffmann,  F.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Volkert, C. A., Heiland, B., & Kauffmann, F. (2003). Preparation of hard-to-make TEM samples using the FIB microscope. Praktische Metallographie-Practical Metallography, 40(4), 193-208.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-2CE8-C
Abstract
There is no abstract available