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Understanding interfacial bonding in alumina doped yttria-stabilised tetragonal zirconia using electron energy loss spectroscopy

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons76047

Scheu,  C.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76016

Rühle,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Scott, A. J., Brydson, R., Dennis, C. A., Ross, I. M., Rainforth, W. M., Scheu, C., et al. (2004). Understanding interfacial bonding in alumina doped yttria-stabilised tetragonal zirconia using electron energy loss spectroscopy. In S. McVitie, & D. McComb (Eds.), Electron Microscopy and Analysis 2003. Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference (pp. 433-436). Bristol: IOP Publishing.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-2C4E-8
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