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TEM-Untersuchungen zur Segregation von Ga an Korngrenzen in Al

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Schmidt,  S.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Schmidt, S. (2003). TEM-Untersuchungen zur Segregation von Ga an Korngrenzen in Al. PhD Thesis, Universität Stuttgart, Stuttgart.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-2C13-A
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