Electromigration-induced plastic deformation in passivated metal lines

Valek, B. C.; Bravman, J. C.; Tamura, N.; MacDowell, A. A.; Celestre, R. S.; Padmore, H. A.; Spolenak, R.; Brown, W. L.; Batterman, B. W.; Patel, J. R.

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Electromigration-induced plastic deformation in passivated metal lines

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Spolenak, R.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Valek, B. C., Bravman, J. C., Tamura, N., MacDowell, A. A., Celestre, R. S., Padmore, H. A., et al. (2003). Electromigration-induced plastic deformation in passivated metal lines. Applied Physics Letters, 81(22), 4168-4170.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-2C0B-D

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