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A new synchrotron-based technique for measuring stresses in ultrathin metallic films

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Böhm,  J.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Gruber,  P.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Spolenak,  R.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Wanner,  A.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Arzt,  E.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Metallkunde;

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Citation

Böhm, J., Gruber, P., Spolenak, R., Wanner, A., & Arzt, E. (2004). A new synchrotron-based technique for measuring stresses in ultrathin metallic films. In P. Anderson, T. Foecke, A. Misra, & R. Rudd (Eds.), Nanoscale Materials and Modeling-Relations Among Processing, Microstructure and Mechanical Properties (pp. P1.6.1-P1.6.6.). Warrendale, PA: Materials Research Society.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-2BC5-F
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