EELS and EFTEM studies at low energy losses and high energy resolution

Sigle, W.

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EELS and EFTEM studies at low energy losses and high energy resolution

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Sigle, W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Sigle, W. (2004). EELS and EFTEM studies at low energy losses and high energy resolution. In I. Anderson, R. Price, E. Hall, E. Clark, & S. McKernan (Eds.), Proceedings Microscopy and Microanalysis 2004, Suppl. 2 (pp. 258CD-259CD). New York, USA: Press Syndicate of the University of Cambridge.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-2AE1-8

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