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Creep properties and texture of a high niobium containing gamma-TiAl sheet material

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Clemens,  H.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Dehm,  G.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Weller,  M.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Bystrzanowski, S., Bartels, A., Gerling, R., Schimansky, F., Clemens, H., Kestler, H., et al. (2004). Creep properties and texture of a high niobium containing gamma-TiAl sheet material. In L. G., & A. J. (Eds.), Ti-2003 Science and Technology. Vol. 4 (pp. 2401-2408). Weinheim: Wiley-VCH Verlag GmbH.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-2AC5-8
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