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Transmission electron microscopy of fluorapatite-gelatine composite particles using focused ion beam milling

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons76232

Volkert,  C. A.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

Busch,  S.
Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75570

Heiland,  B.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75388

Dehm,  G.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Volkert, C. A., Busch, S., Heiland, B., & Dehm, G. (2004). Transmission electron microscopy of fluorapatite-gelatine composite particles using focused ion beam milling. Journal of Microscopy, 214, 208-212.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-2AAA-6
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