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Journal Article

Transmission electron microscopy of fluorapatite-gelatine composite particles using focused ion beam milling

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Volkert,  C. A.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

Busch,  S.
Max Planck Society;

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Heiland,  B.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Dehm,  G.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Volkert, C. A., Busch, S., Heiland, B., & Dehm, G. (2004). Transmission electron microscopy of fluorapatite-gelatine composite particles using focused ion beam milling. Journal of Microscopy, 214, 208-212.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-2AAA-6
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