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Journal Article

Enhanced flux line pinning by substrate induced defects in YBCO thin films

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons75210

Albrecht,  J.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75767

Leonhardt,  S.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

Habermeier,  H.-U.
Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75325

Brück,  S.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76138

Spolenak,  R.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75720

Kronmüller,  H.
Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Albrecht, J., Leonhardt, S., Habermeier, H.-U., Brück, S., Spolenak, R., & Kronmüller, H. (2004). Enhanced flux line pinning by substrate induced defects in YBCO thin films. Physica C, 404, 18-21.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-2A94-5
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