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Parameter Detection of Thin Films from their X-Ray Reflectivity by Support Vector Machines.

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons76284

Welzel,  U.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Strauß, D., Steidl, G., & Welzel, U. (2004). Parameter Detection of Thin Films from their X-Ray Reflectivity by Support Vector Machines. Applied Numerical Mathematics, 48, 223-236.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-29E0-1
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