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Tensile testing of ultrathin polycrystalline films: A new synchrotron based method

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Böhm,  J.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Gruber,  P.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Spolenak,  R.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Stierle,  A.
Former Central Scientific Facility ANKA Synchroton Beamline, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Wanner,  A.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Arzt,  E.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Metallkunde;

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Citation

Böhm, J., Gruber, P., Spolenak, R., Stierle, A., Wanner, A., & Arzt, E. (2004). Tensile testing of ultrathin polycrystalline films: A new synchrotron based method. Review of Scientific Instruments, 75(4), 1110-1119.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-2964-C
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