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Variation of the electron inelastic mean free path during depth profiling of the Fe/Si interface as determined by quantitative REELS

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons75598

Hofmann,  S.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Prieto, P., Hofmann, S., Elizalde, E., & Sanz, J. M. (2004). Variation of the electron inelastic mean free path during depth profiling of the Fe/Si interface as determined by quantitative REELS. Surface and Interface Analysis, 36(10), 1392-1401.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-28B6-B
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