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Dedicated Max Planck beamline for the in-situ investigation of interfaces and thin films

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Stierle,  A.
Former Central Scientific Facility ANKA Synchroton Beamline, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Steinhäuser,  A.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Rühm,  A.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Renner,  F.U.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Weigel,  R.
Former Central Scientific Facility ANKA Synchroton Beamline, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Kasper,  N.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Dosch,  H.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Theoretische und Angewandte Physik;

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Citation

Stierle, A., Steinhäuser, A., Rühm, A., Renner, F., Weigel, R., Kasper, N., et al. (2004). Dedicated Max Planck beamline for the in-situ investigation of interfaces and thin films. Review of Scientific Instruments, 75(12), 5302-5307.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-2889-2
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