English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Journal Article

Reversible orientation-biased grain growth in thin metal films induced by a focused ion beam

MPS-Authors
/persons/resource/persons76138

Spolenak,  R.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons76034

Sauter,  L.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75427

Eberl,  C.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Spolenak, R., Sauter, L., & Eberl, C. (2005). Reversible orientation-biased grain growth in thin metal films induced by a focused ion beam. Scripta Materialia, 53, 1201-1296.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-2862-7
Abstract
There is no abstract available