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Reversible orientation-biased grain growth in thin metal films induced by a focused ion beam

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http://pubman.mpdl.mpg.de/cone/persons/resource/persons76138

Spolenak,  R.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76034

Sauter,  L.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75427

Eberl,  C.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Spolenak, R., Sauter, L., & Eberl, C. (2005). Reversible orientation-biased grain growth in thin metal films induced by a focused ion beam. Scripta Materialia, 53, 1201-1296.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-2862-7
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