de.mpg.escidoc.pubman.appbase.FacesBean
English
 
Help Guide Disclaimer Contact us Login
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Journal Article

Electrical resistance of low-angle tilt grain boundaries in acceptor-doped SrTiO3 as a function of misorientation angle

MPS-Authors

De Souza,  R. A.
Max Planck Society;

Fleig,  J.
Max Planck Society;

Maier,  J.
Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76328

Zhang,  Z.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76113

Sigle,  W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76016

Rühle,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

Locator
There are no locators available
Fulltext (public)
There are no public fulltexts available
Supplementary Material (public)
There is no public supplementary material available
Citation

De Souza, R. A., Fleig, J., Maier, J., Zhang, Z., Sigle, W., & Rühle, M. (2005). Electrical resistance of low-angle tilt grain boundaries in acceptor-doped SrTiO3 as a function of misorientation angle. Journal of Applied Physics, 97: 053502.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-27C5-2
Abstract
There is no abstract available