de.mpg.escidoc.pubman.appbase.FacesBean
English
 
Help Guide Disclaimer Contact us Login
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Journal Article

Analytical TEM study of microstructure-property relations in liquid-phase-sintered SiC with AlN-Y2O3 additives

MPS-Authors
http://pubman.mpdl.mpg.de/cone/persons/resource/persons76002

Rixecker,  G.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons75211

Aldinger,  F.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Nichtmetallische Anorganische Materialien;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76047

Scheu,  C.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

http://pubman.mpdl.mpg.de/cone/persons/resource/persons76016

Rühle,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

Locator
There are no locators available
Fulltext (public)
There are no public fulltexts available
Supplementary Material (public)
There is no public supplementary material available
Citation

Huang, R., Gu, H., Rixecker, G., Aldinger, F., Scheu, C., & Rühle, M. (2005). Analytical TEM study of microstructure-property relations in liquid-phase-sintered SiC with AlN-Y2O3 additives. Zeitschrift für Metallkunde, 96(5), 496-502.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-26AA-C
Abstract
There is no abstract available