English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
  Local TagsRelease HistoryDetailsSummary

Released
Journal Article

Analytical TEM study of microstructure-property relations in liquid-phase-sintered SiC with AlN-Y2O3 additives

MPS-Authors
/persons/resource/persons76002

Rixecker,  G.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75211

Aldinger,  F.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Nichtmetallische Anorganische Materialien;

/persons/resource/persons76047

Scheu,  C.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons76016

Rühle,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Huang, R., Gu, H., Rixecker, G., Aldinger, F., Scheu, C., & Rühle, M. (2005). Analytical TEM study of microstructure-property relations in liquid-phase-sintered SiC with AlN-Y2O3 additives. Zeitschrift für Metallkunde, 96(5), 496-502.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-26AA-C
Abstract
There is no abstract available